ATS 2025
The 34th Asian Test Symposium (ATS) and the 9th International Test Conference in Asia (ITC-Asia) will be held in conjunction with SEMICON Japan 2025 in Tokyo, Japan. This joint event provides a valuable platform for academic researchers and industry professionals worldwide to present their latest results and exchange ideas in system, board, and device testing, as well as broader test technologies.
所属领域：计算机体系结构/并行与分布计算/存储系统
CCF推荐：C
时间地点：2025年12月16日-东京（日本）
大会议题
·AI test and Test for AI
·Analog/Mixed-Signal Test
·ATE Design
·Automatic Test Pattern Generation (ATPG)
·Autonomous Testing
·Board-Level Testing and Diagnosis
·Boundary Scan Test
·Built-In Self-Test (BIST)
·CPU/GPU Test
·Connectivity Testing
·Defect-Based Test
·Delay and Performance Test
·Dependability and Functional Safety
·Design Verification, Validation, and Debug
·Design for Testability (DFT)
·Diagnosis and Silicon Debug
·Fault Diagnosis and Failure Analysis
·Fault Modeling and Simulation
·Fault Tolerance
·Hardware Oriented Security and Trust
·High-Speed I/O Test
·Heterogeneous Testing
·Low-Power IC Test
·Machine Learning in Test
·Memory Test, Diagnosis, and Repair
·Multi-/Many-core Processor Test
·Online Test
·On-Chip Measurement
·Power/Thermal/Reliability Issues in Test
·Reconfigurable System Test
·Reliability and Testing for Emerging/Approximate/Quantum Computing
·RF Test
·Safety and Test for Automotive ICs
·Self-Repair • SiP, Chiplet, 2.5D and 3D IC Test
·Software Test and Reliability
·Standards in Test
·System-on-Chip Test
·Test Compression
·Test Economics
·Test Quality
·Test Synthesis
·Test for Biomedical Circuits and Systems
·Test for MEMS and Microfluidic Systems
·Test for Nanoscale Devices and Emerging Technologies
·Test for Reversible and Quantum Circuits
·Test for Sensors and IoT
·Yield Analysis, Learning, and Enhancement